Design, Analysis and Test of Logic Circuits Under Uncertainty

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs,...

Full description

Main Author: Krishnaswamy, Smita.
Corporate Author: SpringerLink (Online service)
Other Authors: Markov, Igor L., Hayes, John P.
Format: Electronic
Language: English
Published: Dordrecht : Springer Netherlands : 2013.
Series: Lecture Notes in Electrical Engineering, 115
Subjects:
Online Access: http://dx.doi.org/10.1007/978-90-481-9644-9
Tags: Add Tag
No Tags, Be the first to tag this record!